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> Product >Discrete Test System > EAS2100V(

discrete test system

)
 
discrete test system  
EAS2100V
 
The EAS2X00V test device series to guarantee the energy for switching during the Inductive load and performs ruggedness testing of power MOSFETs and IGBTs.
The EAS2X00V is the capability of P- and N-Channel MOSFETs and IGBTs by stressing them to controlled energy levels.
This is accomplished by the devices driving an unclamped inductive load.
The Inductive load can programmable from 10uH to 79.99mH.
Automation of current ID detection using a high speed ID detection function.
Device currents add constantly monitored and testing is terminated if currents exceed programmable levels or if the currents fail to reach the programmable levels in a specified time.
 
 
Semiconductor Tester / Discrete Tester
BVdss & ID 2000V/100A,2200V/200A,2300V/300A
Can be Check Pre O/S and Post O/S
Programmable Inductive Load( 10uH to 79.99mH)
Programmable VG Pulse Width
Programmable Handler Interface Signals
Easy Operation & Maintenance
Quick set-up Installation
 
 
Section Specification
OS Environment Widnows XP
Tester OS SignMe for EAS2100V
Test Program
C Language
 
 

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